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        <identifier>oai:www.ideals.illinois.edu:2142/82748</identifier>
        <datestamp>2023-07-11</datestamp>
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        <thesis xmlns="http://www.ndltd.org/standards/metadata/etdms/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:dc="http://purl.org/dc/elements/1.1/" xsi:schemaLocation="http://www.ndltd.org/standards/metadata/etdms/1.1/ http://www.ndltd.org/standards/metadata/etdms/1.1/etdms11.xsd http://purl.org/dc/elements/1.1/ http://www.ndltd.org/standards/metadata/etdms/1.1/etdmsdc.xsd">
          <dc:contributor>Cahill, David G.</dc:contributor>
          <dc:contributor>Greene, J.E.</dc:contributor>
          <dc:creator>Wall, Marcel Arlan</dc:creator>
          <dc:date>2015-09-25T20:52:49Z</dc:date>
          <dc:date>2015-09-25T20:52:49Z</dc:date>
          <dc:date>10000-01-01</dc:date>
          <dc:date>2003</dc:date>
          <dc:date>2003</dc:date>
          <dc:description>I use scanning tunneling microscopy to study the nucleation of homoepitaxial stoichiometric TiN layers grown on TiN(001) by ultrahigh vacuum reactive magnetron sputtering in pure N2. Nucleation lengths are measured using  in-situ scanning tunneling microscopy as a function of temperature and nitrogen gas fraction   fN2  in an Ar/N2 gas mixture on two-dimensional islands as well as on large open terraces. The characteristic island size Rc necessary to nucleate a new layer decreases continuously with   fN2 , varying from 18.0 nm at Ts = 740&amp;deg;C with   fN2  = 0.10 to 11.2 nm with   fN2  = 1.00. At low growth temperatures, 500 &amp;le; Ts &amp;le; 865&amp;deg;C, nucleation is diffusion limited independent of   fN2  and I extract a surface diffusion energy of 1.1 +/- 0.1 eV for TiN(001) growth with   fN2  = 0.10 and 1.4 +/- 0.1 eV in pure N2. At higher temperatures, 865 &lt; Ts &amp;le; 1010&amp;deg;C, nucleation is limited by the formation rate of stable clusters for which I obtain an activation energy of 2.4 +/- 0.2 eV with   fN2  = 0.10 and 2.6 +/- 0.2 eV with   fN2  = 1.00. Ab-initio calculations combined with my experimental results suggest that the primary diffusing adspecies during growth of TiN(001) in pure nitrogen are TiNx molecules with x = 2 and/or 3. I attribute the decrease in Es for growth at   fN2  = 0.10 to a lower steady-state N coverage resulting in a decrease in x.</dc:description>
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  Previous issue date: 2003</dc:description>
          <dc:description>Embargo set by: Seth Robbins for item 84029
Lift date: Forever
Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs</dc:description>
          <dc:description>Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs</dc:description>
          <dc:description>U of I Only</dc:description>
          <dc:description>113 p.</dc:description>
          <dc:description>Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2003.</dc:description>
          <dc:identifier>http://hdl.handle.net/2142/82748</dc:identifier>
          <dc:identifier>(MiAaPQ)AAI3111653</dc:identifier>
          <dc:language>eng</dc:language>
          <dc:subject>Engineering, Materials Science</dc:subject>
          <dc:title>Nucleation Kinetics During Homoepitaxial Growth of Titanium Nitride(001) by Reactive Magnetron Sputtering</dc:title>
          <dc:type>text</dc:type>
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            <department>Materials Science and Engineering</department>
            <discipline>Materials Science and Engineering</discipline>
            <grantor>University of Illinois at Urbana-Champaign</grantor>
            <level>Dissertation</level>
            <name>Ph.D.</name>
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