2026-09-19T10:20:40Z https://www.ideals.illinois.edu/oai-pmh

oai:www.ideals.illinois.edu:2142/83810 2023-07-11 col_2142_5131 col_2142_14787 com_2142_5130 com_2142_9630 com_2142_234

Mackin, Thomas J. Horn, Gavin Peter 2015-09-25T21:12:14Z 2015-09-25T21:12:14Z 10000-01-01 2004 2004 *This dissertation is a compound document (contains both a paper copy and a CD as part of the dissertation). The CD requires the following system requirements: Micrsoft Office; Windows MediaPlayer or RealPlayer. Made available in DSpace on 2015-09-25T21:12:14Z (GMT). No. of bitstreams: 3 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 3153225.pdf: 19088277 bytes, checksum: a7a0c7b547db0e29452bb7b34b335cbe (MD5) 3153225.zip: 70366547 bytes, checksum: dbdf30bf95a13a23f9828c1468f1c087 (MD5) Previous issue date: 2004 Embargo set by: Seth Robbins for item 85091 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs U of I Only 197 p. Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2004. http://hdl.handle.net/2142/83810 (MiAaPQ)AAI3153225 eng Engineering, Mechanical On Infrared Grey -Field Photoelasticity and Applications for Defect Detection in Bonded Semiconductor Devices text Mechanical Engineering Mechanical Engineering University of Illinois at Urbana-Champaign Dissertation Ph.D.