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oai:www.ideals.illinois.edu:2142/85899 2023-07-11 col_2142_5131 col_2142_14837 com_2142_5130 com_2142_14836 com_2142_234

Heuser, Brent J. Allain, Monica Marie Cortez 2015-09-28T14:50:59Z 2015-09-28T14:50:59Z 10000-01-01 2004 2004 Evidence of significant dislocation formation has been confirmed with high-resolution electron microscopy (HREM) for the 1200A Nb film. The HREM images were used to estimate a dislocation density of 1012 cm-2 after repeated cycling. A residual out-of-plane compressive strain was observed in the 1200A Nb film after complete deuterium evolution. This observation can be explained by irreversible interstitial dislocation loop formation. Made available in DSpace on 2015-09-28T14:50:59Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 3130870.pdf: 5175065 bytes, checksum: 06e564e625707f88b9c18fda2ccd7272 (MD5) Previous issue date: 2004 Embargo set by: Seth Robbins for item 87180 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs U of I Only 159 p. Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2004. http://hdl.handle.net/2142/85899 (MiAaPQ)AAI3130870 eng Engineering, Materials Science Lattice Strain Measurements of Deuteride Phase Formation in Epitaxial Niobium on Sapphire text Nuclear Engineering Nuclear Engineering University of Illinois at Urbana-Champaign Dissertation Ph.D.