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Klemperer, Walter G. Lee, Jason 2015-09-28T21:57:26Z 2015-09-28T21:57:26Z 10000-01-01 2002 2002 The Si-H bonds on the H-Si(111) surface and Co2(CO)8 in n-heptane solution reacted to form a well defined submonolayer coverage of Co(CO)4 above the surface plane of Si(111). Transmission Fourier-transform infrared spectroscopy analysis of (OC) 4Co-Si(111) yielded structural and geometric information about the adsorbate. Accurate quantitative areal concentrations of cobalt deposited on the surface were obtained using Rutherford backscattering spectrometry. X-ray photoelectron spectroscopy analysis furnished the chemical state of the adsorbates as well as quantitative information. Static secondary ion mass spectrometry analysis detected the presence of the desired product and trace amounts of byproducts on the surface. Finally, numerical simulations of irreversible adsorption were used to calculate theoretical yields for comparisons to the experimental coverage values. Made available in DSpace on 2015-09-28T21:57:26Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 3044155.pdf: 3772679 bytes, checksum: a8063ee40d4972c9428655c16a728c6a (MD5) Previous issue date: 2002 Embargo set by: Seth Robbins for item 89164 Lift date: Forever Reason: Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs Restricted to the U of I community idenfinitely during batch ingest of legacy ETDs U of I Only 99 p. Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2002. http://hdl.handle.net/2142/87883 (MiAaPQ)AAI3044155 eng Engineering, Materials Science Deposition of Metal Oxides and Metal Carbonyls on Silicon Surfaces Using Solution Chemistry text University of Illinois at Urbana-Champaign Dissertation Ph.D.