<?xml version="1.0" encoding="UTF-8"?>
<?xml-stylesheet type="text/xsl" href="/oai-pmh.xsl"?>
<OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd">
  <responseDate>2026-09-18T19:11:39Z</responseDate>
  <request identifier="oai:www.ideals.illinois.edu:2142/89068" metadataPrefix="etdms" verb="GetRecord">https://www.ideals.illinois.edu/oai-pmh</request>
  <GetRecord>
    <record>
      <header>
        <identifier>oai:www.ideals.illinois.edu:2142/89068</identifier>
        <datestamp>2023-07-11</datestamp>
        <setSpec>col_2142_5131</setSpec>
        <setSpec>col_2142_8888</setSpec>
        <setSpec>com_2142_5130</setSpec>
        <setSpec>com_2142_8887</setSpec>
        <setSpec>com_2142_234</setSpec>
      </header>
      <metadata>
        <thesis xmlns="http://www.ndltd.org/standards/metadata/etdms/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:dc="http://purl.org/dc/elements/1.1/" xsi:schemaLocation="http://www.ndltd.org/standards/metadata/etdms/1.1/ http://www.ndltd.org/standards/metadata/etdms/1.1/etdms11.xsd http://purl.org/dc/elements/1.1/ http://www.ndltd.org/standards/metadata/etdms/1.1/etdmsdc.xsd">
          <dc:subject>low cost</dc:subject>
          <dc:subject>high performance</dc:subject>
          <dc:contributor>Chen, Deming</dc:contributor>
          <dc:creator>Campbell, Keith A</dc:creator>
          <dc:date>2016-03-02T19:34:35Z</dc:date>
          <dc:date>2016-03-02T19:34:35Z</dc:date>
          <dc:date>2015-12-08</dc:date>
          <dc:date>2015-12</dc:date>
          <dc:description>System-on-chip design is becoming increasingly complex as technology scaling enables more and more functionality on a chip. This scaling and complexity has resulted in a variety of reliability and validation challenges including logic bugs, hot spots, wear-out, and soft errors. To make matters worse, as we reach the limits of Dennard scaling, efforts to improve system performance and energy efficiency have resulted in the integration of a wide variety of complex hardware accelerators in SoCs. Thus the challenge is to design complex, custom hardware that is efficient, but also correct and reliable.
High-level synthesis shows promise to address the problem of complex hardware design by providing a bridge from the high-productivity software domain to the hardware design process. Much research has been done on high-level synthesis efficiency optimizations. This thesis shows that high-level synthesis also has the power to address validation and reliability challenges through two solutions.
One solution for circuit reliability is modulo-3 shadow datapaths: performing lightweight shadow computations in modulo-3 space for each main computation. We leverage the binding and scheduling flexibility of high-level synthesis to detect control errors through diverse binding and minimize area cost through intelligent checkpoint scheduling and modulo-3 reducer sharing. We introduce logic and dataflow optimizations to further reduce cost. We evaluated our technique with 12 high-level synthesis benchmarks from the arithmetic-oriented PolyBench benchmark suite using FPGA emulated netlist-level error injection. We observe coverages of 99.1% for stuck-at faults, 99.5% for soft errors, and 99.6% for timing errors with a 25.7% area cost and negligible performance impact. Leveraging a mean error detection latency of 12.75 cycles (4150x faster than end result check) for soft errors, we also explore a rollback recovery method with an additional area cost of 28.0%, observing a 175x increase in reliability against soft errors.
Another solution for rapid post-silicon validation of accelerator designs is Hybrid Quick Error Detection (H-QED): inserting signature generation logic in a hardware design to create a heavily compressed signature stream that captures the internal behavior of the design at a fine temporal and spatial granularity for comparison with a reference set of signatures generated by high-level simulation to detect bugs. Using H-QED, we demonstrate an improvement in error detection latency (time elapsed from when a bug is activated to when it manifests as an observable failure) of two orders of magnitude and a threefold improvement in bug coverage compared to traditional post-silicon validation techniques. H-QED also uncovered previously unknown bugs in the CHStone benchmark suite, which is widely used by the HLS community. H-QED incurs less than 10% area overhead for the accelerator it validates with negligible performance impact, and we also introduce techniques to minimize any possible intrusiveness introduced by H-QED.</dc:description>
          <dc:description>Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2016-03-02 without embargo terms</dc:description>
          <dc:description>The student, Keith Campbell, accepted the attached license on 2015-12-08 at 10:06.</dc:description>
          <dc:description>The student, Keith Campbell, submitted this Thesis for approval on 2015-12-08 at 11:04.</dc:description>
          <dc:description>This Thesis was approved for publication on 2015-12-08 at 15:18.</dc:description>
          <dc:description>DSpace SAF Submission Ingestion Package generated from Vireo submission #8964 on 2016-03-02 at 12:52:00</dc:description>
          <dc:description>Made available in DSpace on 2016-03-02T19:34:35Z (GMT). No. of bitstreams: 4
CAMPBELL-THESIS-2015.pdf: 1416717 bytes, checksum: 528eed71187e6875f92f8f4102b1974d (MD5)
Archive.zip: 980583 bytes, checksum: 038f09662aa2e954d88fc930e089cdb0 (MD5)
repo.bundle: 1114849 bytes, checksum: 949465cd60d5306bf00ce85493893994 (MD5)
LICENSE.txt: 4211 bytes, checksum: 16cb38fbe4f884d7cae95df0b53bd309 (MD5)
  Previous issue date: 2015-12-08</dc:description>
          <dc:format>application/pdf</dc:format>
          <dc:identifier>http://hdl.handle.net/2142/89068</dc:identifier>
          <dc:language>en</dc:language>
          <dc:rights>Copyright 2015 Keith A. Campbell</dc:rights>
          <dc:subject>High-level synthesis</dc:subject>
          <dc:subject>Automation</dc:subject>
          <dc:subject>error detection</dc:subject>
          <dc:subject>scheduling</dc:subject>
          <dc:subject>binding</dc:subject>
          <dc:subject>compiler transformation</dc:subject>
          <dc:subject>compiler optimization</dc:subject>
          <dc:subject>pipelining</dc:subject>
          <dc:subject>modulo arithmetic</dc:subject>
          <dc:subject>logic optimization</dc:subject>
          <dc:subject>state machine</dc:subject>
          <dc:subject>datapath, control logic</dc:subject>
          <dc:subject>shadow logic</dc:subject>
          <dc:subject>electrical bugs</dc:subject>
          <dc:subject>Aliasing</dc:subject>
          <dc:subject>stuck-at faults</dc:subject>
          <dc:subject>soft errors</dc:subject>
          <dc:subject>timing errors</dc:subject>
          <dc:subject>checkpointing</dc:subject>
          <dc:subject>rollback</dc:subject>
          <dc:subject>recovery</dc:subject>
          <dc:subject>post-silicon validation</dc:subject>
          <dc:subject>Accelerators</dc:subject>
          <dc:subject>system on a chip</dc:subject>
          <dc:subject>signature generation</dc:subject>
          <dc:subject>execution signatures</dc:subject>
          <dc:subject>execution hashing</dc:subject>
          <dc:subject>logic bugs</dc:subject>
          <dc:subject>nondeterministic bugs</dc:subject>
          <dc:subject>masked errors</dc:subject>
          <dc:subject>circuit reliability</dc:subject>
          <dc:subject>hot spots</dc:subject>
          <dc:subject>wear out</dc:subject>
          <dc:subject>silent data corruption</dc:subject>
          <dc:subject>observability</dc:subject>
          <dc:subject>detection latency</dc:subject>
          <dc:subject>mixed datapath</dc:subject>
          <dc:subject>diversity</dc:subject>
          <dc:subject>checkpoint corruption</dc:subject>
          <dc:subject>error injection</dc:subject>
          <dc:subject>error removal</dc:subject>
          <dc:subject>Quick Error Detection (QED)</dc:subject>
          <dc:subject>Hybrid Quick Error Detection (H-QED)</dc:subject>
          <dc:subject>hybrid hardware/software</dc:subject>
          <dc:subject>execution tracing</dc:subject>
          <dc:subject>address conversion</dc:subject>
          <dc:subject>undefined behavior</dc:subject>
          <dc:subject>High-Level Synthesis (HLS) engine bugs</dc:subject>
          <dc:subject>detection coverage</dc:subject>
          <dc:title>Low-cost error detection through high-level synthesis</dc:title>
          <dc:type>text</dc:type>
          <dc:type>text</dc:type>
          <degree>
            <department>Electrical &amp; Computer Engineering</department>
            <discipline>Electrical &amp; Computer Engineering</discipline>
            <grantor>University of Illinois at Urbana-Champaign</grantor>
            <level>Thesis</level>
            <name>M.S.</name>
          </degree>
        </thesis>
      </metadata>
    </record>
  </GetRecord>
</OAI-PMH>
