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oai:www.ideals.illinois.edu:2142/89078 2023-07-11 col_2142_5131 col_2142_8888 com_2142_5130 com_2142_8887 com_2142_234

Electrostatic Discharge (ESD) Transmission Line-Pulse (TLP) High current pulse characterization of semiconductor devices text text Rosenbaum, Elyse Thomson, Nicholas A 2016-03-02T19:44:59Z 2016-03-02T19:44:59Z 2015-12-09 2015-12 A new ESD testing system, the exponential-edge transmission line pulse system (EETLP), is presented. EETLP generates 100 ns square pulses with a variable, exponentially decaying falling edge. When applied to an ESD protection device, the pulse shape allows for capture of both the transient and quasi-steady-state responses, in the context of a single measurement. EETLP provides unprecedented insight into the turn-off dynamics of snapback-type devices. Device measurement data are presented to demonstrate the capabilities of EETLP. Submission original under an indefinite embargo labeled 'Open Access'. The submission was exported from vireo on 2016-03-02 without embargo terms The student, Nicholas Thomson, accepted the attached license on 2015-12-08 at 18:05. The student, Nicholas Thomson, submitted this Thesis for approval on 2015-12-08 at 18:14. This Thesis was approved for publication on 2015-12-09 at 17:03. DSpace SAF Submission Ingestion Package generated from Vireo submission #8977 on 2016-03-02 at 12:52:33 Made available in DSpace on 2016-03-02T19:44:59Z (GMT). No. of bitstreams: 2 THOMSON-THESIS-2015.pdf: 1793381 bytes, checksum: 458ce308770e0bac034351f59fe9e118 (MD5) LICENSE.txt: 4213 bytes, checksum: 103bcef4a95b082d3c8643d75eed74cd (MD5) Previous issue date: 2015-12-09 application/pdf http://hdl.handle.net/2142/89078 en Copyright 2015 Nicholas Thomson Electrical & Computer Engineering Electrical & Computer Engineering University of Illinois at Urbana-Champaign Thesis M.S.