University of Illinois Urbana-Champaign

Fault-Injection-Based Assessment of Fail-Silence Provided by Process Duplication versus Internal Error Detection in Scientific-Based Applications

Stott, David T.; Speirs, Neil A.; Xu, Jun; Bagchi, Saurabh; Whisnant, Keith; Kalbarczyk, Zbigniew; Iyer, Ravishankar K.

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