Fault-Tolerant Computing: An Overview

Iyer, R.K.; Patel, J.H.; Fuchs, W.K.; Banerjee, P.; Horst, R.

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https://hdl.handle.net/2142/74516 Copy

Description

Title

Fault-Tolerant Computing: An Overview

Author(s)

• Iyer, R.K.
• Patel, J.H.
• Fuchs, W.K.
• Banerjee, P.
• Horst, R.

Issue Date

1991-06

Keyword(s)

• Fault tolerance
• Reliability
• Test generation
• Simulation
• Modeling
• Measurement
• Commercial designs

Publisher

Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-91-2232, CRHC-91-22

Type of Resource

text

Language

English

Permalink

http://hdl.handle.net/2142/74516

Sponsor(s)/Grant Number(s)

• NASA / NAG-1-613
• Semiconductor Research Corporation / 90-DP-109
• Joint Services Electronics Program / N00014-90-J-1270

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