Parallel Testing for Pattern Sensitive Faults in Semiconductor Random Access Memory
Mazumder, Pinaki; Patel, Janak H.
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https://hdl.handle.net/2142/74381
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Title Parallel Testing for Pattern Sensitive Faults in Semiconductor Random Access Memory Author(s) Mazumder, Pinaki Patel, Janak H. Issue Date 1986-08 Keyword(s) RAM Passive neighborhood pattern sensitive fault Active neighborhood pattern sensitive fault Bit lines Word lines Sense amplifiers Date of Ingest 2015-04-06T20:55:11Z 2017-07-14T23:07:54Z Publisher Coordinated Science Laboratory, University of Illinois at Urbana-Champaign Series/Report Name or Number Coordinated Science Laboratory Report no. UILU-ENG-86-2232, CSG-56 Type of Resource text Genre of Resource Report (Grant or Annual) Language English Permalink http://hdl.handle.net/2142/74381 Sponsor(s)/Grant Number(s) Semiconductor Research Corporation / SRC RSCH 84-06-049-4
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