The Complexity of Test Generation at the Transistor Level

Najm, Farid; Hajj, Ibrahim

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https://hdl.handle.net/2142/74486 Copy

Description

Title

The Complexity of Test Generation at the Transistor Level

Author(s)

• Najm, Farid
• Hajj, Ibrahim

Issue Date

1987-12

Keyword(s)

• Complexity analysis
• MOS circuit testing
• Robust test vectors
• Sensitization
• Switch-level fault models
• Transistor-level test generation

Publisher

Coordinated Science Laboratory, University of Illinois at Urbana-Champaign

Series/Report Name or Number

Coordinated Science Laboratory Report no. UILU-ENG-87-2280, DAC-9

Type of Resource

text

Language

English

Permalink

http://hdl.handle.net/2142/74486

Sponsor(s)/Grant Number(s)

Semiconductor Research Corporation / SRC RSCH 86-12-109

Owning Collections