University of Illinois Urbana-Champaign

Parallel Algorithms for Sequential Circuit Fault Simulation and Test Generation

Krishnaswamy, Dilip

Content Files
97-2221.pdf

Permalink

https://hdl.handle.net/2142/88505

Description

Title
Parallel Algorithms for Sequential Circuit Fault Simulation and Test Generation
Author(s)
Krishnaswamy, Dilip
Issue Date
1997-09
Keyword(s)
  • Parallel genetic algorithms
  • Simulation-based parallel test generation
  • Test set
  • Sequence partitioning
  • Synchronous and asynchronous parallel algorithms
  • Parallel fault simulation
Date of Ingest
  • 2015-12-10T23:21:30Z
  • 2017-07-14T23:13:32Z
Publisher
Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report Name or Number
Coordinated Science Laboratory Report no. UILU-ENG-97-2221, CRHC-97-14
Type of Resource
text
Genre of Resource
Report (Grant or Annual)
Language
en
Permalink
http://hdl.handle.net/2142/88505
Sponsor(s)/Grant Number(s)
Semiconductor Research Corporation and ARPA / 96-DP-109 and DAAH04-94-G0273

Owning Collections

Report - Coordinated Science Laboratory PRIMARY