Parallel Algorithms for Sequential Circuit Fault Simulation and Test Generation
Krishnaswamy, Dilip
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https://hdl.handle.net/2142/88505
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Title Parallel Algorithms for Sequential Circuit Fault Simulation and Test Generation Author(s) Krishnaswamy, Dilip Issue Date 1997-09 Keyword(s) Parallel genetic algorithms Simulation-based parallel test generation Test set Sequence partitioning Synchronous and asynchronous parallel algorithms Parallel fault simulation Date of Ingest 2015-12-10T23:21:30Z 2017-07-14T23:13:32Z Publisher Coordinated Science Laboratory, University of Illinois at Urbana-Champaign Series/Report Name or Number Coordinated Science Laboratory Report no. UILU-ENG-97-2221, CRHC-97-14 Type of Resource text Genre of Resource Report (Grant or Annual) Language en Permalink http://hdl.handle.net/2142/88505 Sponsor(s)/Grant Number(s) Semiconductor Research Corporation and ARPA / 96-DP-109 and DAAH04-94-G0273
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