Compressed and Dynamic Fault Dictionaries for Fault Isolation
Ryan, Paul George
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https://hdl.handle.net/2142/88480
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Title Compressed and Dynamic Fault Dictionaries for Fault Isolation Author(s) Ryan, Paul George Issue Date 1994-09 Keyword(s) VLSI Dictionary formats Compression algorithms Single-fall fault simulation Date of Ingest 2015-12-10T23:21:22Z 2017-07-14T23:15:10Z Publisher Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign Series/Report Name or Number Coordinated Science Laboratory Report no. UILU-ENG-94-2234, CRHC-94-19 Type of Resource text Genre of Resource Report (Grant or Annual) Language en Permalink http://hdl.handle.net/2142/88480 Sponsor(s)/Grant Number(s) Semiconductor Research Corporation / 93-DP-109 Intel Corporation Joint Services Electronics Program / N00014-90-J-1270
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