University of Illinois Urbana-Champaign

Compressed and Dynamic Fault Dictionaries for Fault Isolation

Ryan, Paul George

Content Files
B61-UILU-ENG-94-2234-CRHC-94-19_opt.pdf

Permalink

https://hdl.handle.net/2142/88480

Description

Title
Compressed and Dynamic Fault Dictionaries for Fault Isolation
Author(s)
Ryan, Paul George
Issue Date
1994-09
Keyword(s)
  • VLSI
  • Dictionary formats
  • Compression algorithms
  • Single-fall fault simulation
Date of Ingest
  • 2015-12-10T23:21:22Z
  • 2017-07-14T23:15:10Z
Publisher
Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report Name or Number
Coordinated Science Laboratory Report no. UILU-ENG-94-2234, CRHC-94-19
Type of Resource
text
Genre of Resource
Report (Grant or Annual)
Language
en
Permalink
http://hdl.handle.net/2142/88480
Sponsor(s)/Grant Number(s)
  • Semiconductor Research Corporation / 93-DP-109
  • Intel Corporation
  • Joint Services Electronics Program / N00014-90-J-1270

Owning Collections

Report - Coordinated Science Laboratory PRIMARY