State Justification Using Genetic Algorithms in Sequential Circuit Test Generation
Rudnick, Elizabeth Marie; Patel, Janak H.
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https://hdl.handle.net/2142/74558
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Title State Justification Using Genetic Algorithms in Sequential Circuit Test Generation Author(s) Rudnick, Elizabeth Marie Patel, Janak H. Issue Date 1996-01 Keyword(s) Genetic algorithms Sequential circuits State justification Test generation VLSI circuit testing Date of Ingest 2015-04-06T20:58:22Z 2017-07-14T23:15:11Z Publisher Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign Series/Report Name or Number Coordinated Science Laboratory Report no. UILU-ENG-96-2201, CRHC-96-01 Type of Resource text Genre of Resource Report (Grant or Annual) Language English Permalink http://hdl.handle.net/2142/74558 Sponsor(s)/Grant Number(s) ARPA / DABT63-95-C-0069 Semiconductor Research Corporation / SRC 94-DP-109 Hewlett-Packard
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