Worst Case Voltage Drops in Power and Ground Buses of CMOS VLSI Circuits
Kriplani, Harish
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https://hdl.handle.net/2142/88626
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Title Worst Case Voltage Drops in Power and Ground Buses of CMOS VLSI Circuits Author(s) Kriplani, Harish Issue Date 1993-11 Keyword(s) Voltage drop CMOS circuits VLSI circuit reliability Power and ground buses Maximum current Date of Ingest 2015-12-10T23:22:06Z 2017-07-14T23:57:29Z Publisher Analog and Digital Circuits, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign Series/Report Name or Number Coordinated Science Laboratory Report no. UILU-ENG-93-2248, DAC-43 Type of Resource text Genre of Resource Report (Grant or Annual) Language en Permalink http://hdl.handle.net/2142/88626 Sponsor(s)/Grant Number(s) Texas Instruments Inc., the Semiconductor Research Corporation (SRC), and USAF / 92-DP-109 and F30602-92-C-0059
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