University of Illinois Urbana-Champaign

Fault Diagnosis of Semiconductor Random Access Memories

Thatte, Satish Mukund

Content Files
77-2216.pdf

Permalink

https://hdl.handle.net/2142/75169

Description

Title
Fault Diagnosis of Semiconductor Random Access Memories
Author(s)
Thatte, Satish Mukund
Issue Date
1977-05
Keyword(s)
  • Semiconductor random access memories
  • Functional testing
  • Pattern sensitivity testing
Date of Ingest
  • 2015-04-22T02:53:37Z
  • 2017-07-14T23:57:43Z
Publisher
Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report Name or Number
Coordinated Science Laboratory Report no. UILU-ENG 77-2216, R-769
Type of Resource
text
Genre of Resource
Report (Grant or Annual)
Language
English
Permalink
http://hdl.handle.net/2142/75169
Sponsor(s)/Grant Number(s)
Joint Services Electronics Program / DAAB-07-72-C-0259

Owning Collections

Report - Coordinated Science Laboratory PRIMARY