A Simulation and Redesign System for Circuit Hot-Carrier Reliability
Li, Ping-Chung
Permalink
https://hdl.handle.net/2142/88627
Description
Title A Simulation and Redesign System for Circuit Hot-Carrier Reliability Author(s) Li, Ping-Chung Issue Date 1994-05 Keyword(s) Hot-carrier Reliability Probabilistic simulation VLSI circuits Current estimation Design for reliability Date of Ingest 2015-12-10T23:22:07Z 2017-07-14T23:58:34Z Publisher Analog and Digital Circuits, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign Series/Report Name or Number Coordinated Science Laboratory Report no. UILU-ENG-94-2215, DAC-45 Type of Resource text Genre of Resource Report (Grant or Annual) Language en Permalink http://hdl.handle.net/2142/88627 Sponsor(s)/Grant Number(s) Semiconductor Research Corporation (SRC) and USAF Rome Laboratory / 92-DP-109 and F30602-92-C-0059
Owning Collections
