University of Illinois Urbana-Champaign

A Simulation and Redesign System for Circuit Hot-Carrier Reliability

Li, Ping-Chung

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https://hdl.handle.net/2142/88627

Description

Title
A Simulation and Redesign System for Circuit Hot-Carrier Reliability
Author(s)
Li, Ping-Chung
Issue Date
1994-05
Keyword(s)
  • Hot-carrier
  • Reliability
  • Probabilistic simulation
  • VLSI circuits
  • Current estimation
  • Design for reliability
Publisher
Analog and Digital Circuits, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report Name or Number
Coordinated Science Laboratory Report no. UILU-ENG-94-2215, DAC-45
Type of Resource
text
Language
en
Permalink
http://hdl.handle.net/2142/88627
Sponsor(s)/Grant Number(s)
Semiconductor Research Corporation (SRC) and USAF Rome Laboratory / 92-DP-109 and F30602-92-C-0059

Owning Collections

Report - Coordinated Science Laboratory PRIMARY