University of Illinois Urbana-Champaign

Automatic Test Generation Techniques for Sequential Circuits

Yu, Xiaoming

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https://hdl.handle.net/2142/88520

Description

Title
Automatic Test Generation Techniques for Sequential Circuits
Author(s)
Yu, Xiaoming
Issue Date
2002-09
Keyword(s)
  • Sequential circuit test generation
  • Design for testability
  • Automatic test generation
  • Fault generation
Publisher
Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report Name or Number
Coordinated Science Laboratory Report no. UILU-ENG-02-2209, CRHC-02-06
Type of Resource
text
Language
en
Permalink
http://hdl.handle.net/2142/88520

Owning Collections

Report - Coordinated Science Laboratory PRIMARY