University of Illinois Urbana-Champaign

Symbolic Techniques for VLSI Test and Diagnosis

Kubiak, Kenneth Edward

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https://hdl.handle.net/2142/88470

Description

Title
Symbolic Techniques for VLSI Test and Diagnosis
Author(s)
Kubiak, Kenneth Edward
Issue Date
1994-02
Keyword(s)
  • Testing
  • Diagnosis
  • Test generation
  • Fault simulation
Publisher
Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report Name or Number
Coordinated Science Laboratory Report no. UILU-ENG-94-2207, CRHC-94-06
Type of Resource
text
Language
en
Permalink
http://hdl.handle.net/2142/88470
Sponsor(s)/Grant Number(s)
Semiconductor Research Corporation / 93-DP-109

Owning Collections

Report - Coordinated Science Laboratory PRIMARY