University of Illinois Urbana-Champaign

Statistical Design of MOS VLSI Circuits with Designed Experiments

Yu, Tat-Kwan Edgar

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https://hdl.handle.net/2142/88618

Description

Title
Statistical Design of MOS VLSI Circuits with Designed Experiments
Author(s)
Yu, Tat-Kwan Edgar
Issue Date
1990-03
Keyword(s)
  • Statistical design
  • VLSI design
  • Experimental design
Publisher
Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report Name or Number
Coordinated Science Laboratory Report no. UILU-ENG-90-2208, DAC-18
Type of Resource
text
Language
en
Permalink
http://hdl.handle.net/2142/88618
Sponsor(s)/Grant Number(s)
  • Joint Services Electronics Program / N00014-84-C-0149
  • Semiconductor Research Corporation
  • AT&T Bell Laboratories

Owning Collections

Report - Coordinated Science Laboratory PRIMARY