Design, Diagnosis and Reconfiguration of Defect-Tolerant VLSI
Chang, Ming-Feng
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https://hdl.handle.net/2142/88644
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Title Design, Diagnosis and Reconfiguration of Defect-Tolerant VLSI Author(s) Chang, Ming-Feng Issue Date 1991-01 Keyword(s) Defect-tolerant design Memory diagnosis Reconfiguration Optimal testing K-out-of-n systems Date of Ingest 2015-12-10T23:22:11Z 2017-07-15T01:45:28Z Publisher Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign Series/Report Name or Number Coordinated Science Laboratory Report no. UILU-ENG-91-2203, CRHC-91-1 Type of Resource text Genre of Resource Report (Grant or Annual) Language en Permalink http://hdl.handle.net/2142/88644 Sponsor(s)/Grant Number(s) Semiconductor Research Corporation (SRC) / 90-DP-109 Ministry of Education, Republic of China
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