University of Illinois Urbana-Champaign

Testing and Fault-Tolerance Aspect of High Density VLSI Memory

Mazumder, Pinaki

Content Files
88-2206.pdf

Permalink

https://hdl.handle.net/2142/88601

Description

Title
Testing and Fault-Tolerance Aspect of High Density VLSI Memory
Author(s)
Mazumder, Pinaki
Issue Date
1988-01
Keyword(s)
  • Parallel testing
  • Fault tolerance
  • On-line fault detection
  • Testability
  • VLSI memory
Date of Ingest
  • 2015-12-10T23:21:59Z
  • 2017-07-15T01:45:31Z
Publisher
Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report Name or Number
Coordinated Science Laboratory Report no. UILU-ENG-88-2206, CSG-81
Type of Resource
text
Genre of Resource
Report (Grant or Annual)
Language
en
Permalink
http://hdl.handle.net/2142/88601
Sponsor(s)/Grant Number(s)
Semiconductor Research Corporation / 87-DP-109

Owning Collections

Report - Coordinated Science Laboratory PRIMARY