Automatic Test Generation for Bit-serial VLSI Digital Signal Processors
Roy, Rabindra Kumar
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https://hdl.handle.net/2142/88654
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Title Automatic Test Generation for Bit-serial VLSI Digital Signal Processors Author(s) Roy, Rabindra Kumar Issue Date 1992-02 Keyword(s) Signal processing VLSI Hierarchical testing Test generation Bit-serial architecture Date of Ingest 2015-12-10T23:22:15Z 2017-07-15T01:45:39Z Publisher Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign Series/Report Name or Number Coordinated Science Laboratory Report no. UILU-ENG-92-2208, CRHC-92-05 Type of Resource text Genre of Resource Report (Grant or Annual) Language en Permalink http://hdl.handle.net/2142/88654 Sponsor(s)/Grant Number(s) Semiconductor Research Corporation General Electric / expired gift
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