Computationally Efficient Methods for Accurate Timing and Reliability Simulation of Ultra-Large MOS Circuits
Shih, Yung-Ho
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https://hdl.handle.net/2142/88622
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Title Computationally Efficient Methods for Accurate Timing and Reliability Simulation of Ultra-Large MOS Circuits Author(s) Shih, Yung-Ho Issue Date 1991-07 Keyword(s) Circuit simulation Timing simulation Reliability simulation Waveform relaxation Date of Ingest 2015-12-10T23:22:05Z 2017-07-15T01:45:59Z Publisher Analog and Digital Circuits, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign Series/Report Name or Number Coordinated Science Laboratory Report no. UILU-ENG-91-2235, DAC-27 Type of Resource text Genre of Resource Report (Grant or Annual) Language en Permalink http://hdl.handle.net/2142/88622 Sponsor(s)/Grant Number(s) Joint Services Electronics Program / N00014-90-J-1270
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