University of Illinois Urbana-Champaign

Enhancing Testability of VLSI Circuits Using Partial Reset Techniques

Mathew, Ben

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https://hdl.handle.net/2142/88478

Description

Title
Enhancing Testability of VLSI Circuits Using Partial Reset Techniques
Author(s)
Mathew, Ben
Issue Date
1994-08
Keyword(s)
  • Computer-aided design
  • VLSI
  • Testability schemes
  • Partial reset
  • Sequential circuits
  • Overhead
  • Unrestricted at-speed
Publisher
Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report Name or Number
Coordinated Science Laboratory Report no. UILU-ENG-94-2233, CRHC-94-18
Type of Resource
text
Language
en
Permalink
http://hdl.handle.net/2142/88478
Sponsor(s)/Grant Number(s)
Semiconductor Research Corp.

Owning Collections

Report - Coordinated Science Laboratory PRIMARY