A Comprehensive Fault Model for Concurrent Error Detection in MOS Circuits
Halperin, Daniel Lee
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https://hdl.handle.net/2142/88584
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Title A Comprehensive Fault Model for Concurrent Error Detection in MOS Circuits Author(s) Halperin, Daniel Lee Issue Date 1983-12 Keyword(s) Concurrent error detection Fault models Indeterminate faults MOS circuits Physical failure modes Separable codes Ternary algebra Totally self-checking circuits Date of Ingest 2015-12-10T23:21:54Z 2017-07-15T01:46:39Z Publisher Computer Systems Group, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign Series/Report Name or Number Coordinated Science Laboratory Report no. CSG-25 Type of Resource text Genre of Resource Report (Grant or Annual) Language en Permalink http://hdl.handle.net/2142/88584 Sponsor(s)/Grant Number(s) Naval Electronics Sys. Comm. and Office of Naval Research / N00039-80-C-0556
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