Director of Research (if dissertation) or Advisor (if thesis)
Rosenbaum, Elyse
Department of Study
Electrical & Computer Eng
Discipline
Electrical & Computer Engr
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
M.S.
Degree Level
Thesis
Keyword(s)
Bit flips
ESD
microcontroller
soft errors
Rail clamp
Phase margin
Abstract
IEC-61000-4-2 compliant ESD discharges are performed on a microcontroller. The effect of ESD-induced noise on a digital system having a workload is examined. UART interface present on-chip is used for memory and register readout. Hardware voltage monitors developed previously are included in the design to report the on-die supply noise. A correlation between the voltage disturbance and soft errors induced is identified. The threshold for such disturbances is found. The results are validated across multiple chips. Memory elements are found to be more immune than registers.
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