Snowflakes on a Needle

Wang, Hanwei

Permalink

https://hdl.handle.net/2142/114297 Copy

Description

Title

Snowflakes on a Needle

Author(s)

Wang, Hanwei

Issue Date

2022

Keyword(s)

Electrical and Computer Engineering

Date of Ingest

2022-06-01T16:57:58Z

Abstract

"Atomic force microscopy is a powerful tool in characterizing surface topography at the nanoscale. A sharp needle, with a tip size as small as 10 nanometers, being thousands of times thinner than a hair, is used to gently ""touch"" the sample surface. Piconewton-level force can be picked up. When the sample is illuminated with light, selected properties related to the optical absorption can be probed by the needle. We are particularly interested in studying the certain types of molecules which bare three-dimensional asymmetry, namely chirality. To do so, we fabricate ""snowflakes"" with different chirality to form entanglement with the analyte molecules. In this way, properties related to the chirality of the specimen can be imaged at the nanoscale. We name this technique enantioselective optical force microscopy."

Description

I work like to thank my advisor Yang Zhao for her great support in my research.

Type of Resource

• text
• image

Language

eng

Handle URL

http://hdl.handle.net/2142/114297

Copyright and License Information

Copyright 2022 Hanwei Wang

Owning Collections