Transient Detection in Atomic Force Microscopes

Sahoo, Deepak R.; Sebastian, A.; Salapaka, Murti V.

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https://hdl.handle.net/2142/131552 Copy

Description

Title

Transient Detection in Atomic Force Microscopes

Author(s)

• Sahoo, Deepak R.
• Sebastian, A.
• Salapaka, Murti V.

Issue Date

2002-10-02

Keyword(s)

Stochastic analysis

Publisher

Allerton Conference on Communication, Control, and Computing

Series/Report Name or Number

2002 40th Allerton Conference on Communication, Control, and Computing Proceedings

ISSN

2836-4503

Type of Resource

Text

Genre of Resource

• Conference Paper
• Presentation

Language

eng

Handle URL

https://hdl.handle.net/2142/131552

Copyright and License Information

Copyright 2002 owned by the author(s).

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