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Fault covers in reconfigurable VLSI chips
Doctoral Committee Chair(s)
Department of Study
Degree Granting Institution
University of Illinois at Urbana-Champaign
Reconfigurable chips can be used to enhance the yield of chip production. These chips contain redundant elements that can be used to replace the defective elements. The fault covering problem is to assign the redundant elements to the defective elements such that the chip will function properly. We studied fault covering problems on special architectures, Random Access Memories and Programmable Logic Arrays, and developed a general formulation and algorithm for solving fault covering problems on a large class of reconfigurable chips.