Measuring the Electronic Structure of Atomically Uniform Silver Films Grown on Silicon Using Angle-Resolved Photoemission Spectroscopy
Speer, Nathan James
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https://hdl.handle.net/2142/80585
Description
Title
Measuring the Electronic Structure of Atomically Uniform Silver Films Grown on Silicon Using Angle-Resolved Photoemission Spectroscopy
Author(s)
Speer, Nathan James
Issue Date
2008
Doctoral Committee Chair(s)
Tai Chiang
Department of Study
Physics
Discipline
Physics
Degree Granting Institution
University of Illinois at Urbana-Champaign
Degree Name
Ph.D.
Degree Level
Dissertation
Date of Ingest
2015-09-25T20:03:10Z
Keyword(s)
Physics, Condensed Matter
Language
eng
Abstract
As the film thickness increases, the electronic structure evolves to form the bulk band continuum plus separates surfaces states. A careful analysis of this evolution allows us to separate surface from bulk effects, an important and troubling problem in photoemission spectroscopy. As a result, we are able to clearly identify, for the first time, many surface states buried in the pockets of the d-band manifold that had previously only been theoretically predicted.
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