Transmission-line pulse testing software design

Pace, Molly

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https://hdl.handle.net/2142/91557 Copy

Description

Title

Transmission-line pulse testing software design

Author(s)

Pace, Molly

Contributor(s)

Rosenbaum, Elyse

Issue Date

2016-05

Keyword(s)

• transmission-line test
• very fast transmission-line test
• Tester
• GPIB
• ESD
• C#

Abstract

Transmission-line pulse testing (TLP) and very fast transmission-line pulse testing (VF-TLP) are used to study the high current behaviors of integrated circuits and semiconductor devices, to characterize device response to electrostatic-discharge (ESD) events, and to provide the quasi-static IV curve for the devices. However, commercial TLP and VF-TLP testers are extremely expensive and have limited configurability. Smaller ESD labs need alternatives to expensive equipment. Through this work, I have automated TLP and VF-TLP testing through existing instruments in the lab, making these tests available to research labs on a smaller budget. An oscilloscope, a pulse generator, a parameter analyzer, and a probing station have been integrated using C# programming language to automate both tests. All devices communicate via GPIB and are controlled through a graphical user interface (GUI). This document explains how to set up the GUI and interact with the equipment to create a very reliable tester.

Type of Resource

text

Language

en

Permalink

http://hdl.handle.net/2142/91557

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